Laser Scanner for semiconductor devices

Contributor(s): Language: English Series: NBS SMT SP - 400 - 24 : 1974Publication details: Washington, D.C. ; NBS ; 1977Edition: Description: 72 p; ISBN: Subject(s): | Electronic reliability, Electronics, Laser scanner, Measurement method, Semiconductor device studiesOnline resources: Click here to access online
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNBS SMT SP - 400 - 24 : 1974 Not for loan A41088
Total holds: 0

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