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Test access port and boundary scan architecture

by Maunder, Colin M | Tulloss, Rodham E | .

Series: Edition: Language: English Publication details: Washington ; IEEE Computer Society Press, ; 1990Availability: Items available for loan: 1 Call number: 621.372:621.382 Mau.

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Compatibility and testing of electronic components

by Jowett, C.E | .

Series: Edition: Language: English Publication details: London ; Butterworths, ; 1972Availability: Items available for loan: 1 Call number: 621.372:621.382 Jow.

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