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SYMP. ON DEFECTS IN SILICON; SAN FRANCISCO, MAY 8-13, 1983

by BULLIS W.M.KIMERLING L.C. ED | .

Series: Edition: ELECTRO. S Language: English Publication details: ; p.x, 648, 23 cm ; Availability: Items available for loan: 1 Call number: 537.311.33 Sym.

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Advancement of reliability, processing and automation for integrated circuits with the National Bureau of Standards, ARPA/IC/NBS

by Bullis, W.M | .

Series: Edition: Language: English Publication details: Washington ; U.S. Department of commerce, ; 1981Availability: Items available for loan: 1 Call number: 621.372:621.382 Bul.

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