Effects of electric fields and oxygen ion beams on silicon oxidation kinetics
Language: English Series: Publication details: n. p. ; Stanford University, ; 1983Edition: Description: xxix,283 p; 21 cmISBN:- 0
| Item type | Current library | Call number | Status | Notes | Barcode | |
|---|---|---|---|---|---|---|
Books
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Central Library, IITB Compact Storage - Basement Area | 621.372:621.382 Mod | Available | C13B23 | 144769 |
Total holds: 0
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