BIST enhancements for memory test and repair (R)

By: Lokhande, Kiran RContributor(s): Chandorkar, A.N. and Parekhji, R.ALanguage: English Series: Publication details: Mumbai ; IIT ; 2004Edition: Description: iv,45 p; 29.5 cmISBN: Subject(s): Chandorkar, A.N. and Parekhji, R.A | Theses and Dissertations | Integrated circuits-Testing , Dynamic testing-Mathematical models
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
043:621.382:519.28Lok Not for loan D06B20 205232
Total holds: 0

There are no comments on this title.

to post a comment.
Share

Powered by Koha