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Software metrics and software metrology by Abran, Alain | . Series: Edition: Language: English Publication details: Hoboken ; John Wiley/IEEE Computer Society ; 2010Availability: Items available for loan: 1 Call number: 681.3.06Abr.
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Passive and active measurement: 18th international conference, PAM, proceedings, Sydney, NSW, Australia, Mar. 30-31, 2017 (e-book) by Kaafar, Mohamed Ali [Editor] | Uhlig, Steve [Editor] | Amann, Johanna [Editor]. Series: Lecture notes in computer science ; v.10176Material type: Text; Format:
print
; Literary form:
Not fiction
Language: English Publication details: Cham Springer 2017Online access: DOI URL Availability: Items available for reference: Online (1) .
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