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		No cover image available The conditioned reflex and present-day neurophysiology : by Asratyan, E.A \| . Series: NBS : SMT : SP : 400 - 21 - 1976Edition: Language: English Publication details: Washington, D.C. ; NASA ; 1965Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: LNASA TT F-306. Add to cart (remove)
		No cover image available Recommendations on semiconductor devices : Methods of measurement of the characteristics of diodes and transistors by British Standards Institution \| . Series: NBS SMT SP - 400 - 21 : 1976Edition: Language: English Publication details: London ; BSI ; 1966Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: DBSI-3494.2621.382.2/.3. Add to cart (remove)
		No cover image available Planar test structures for characterizing impurities in silicon by . Series: NBS SMT SP - 400 - 21 : 1976Edition: Language: English Publication details: Washington, D.C. ; NBS ; 1976Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: LNBS SMT SP - 400 - 21 : 1976. Add to cart (remove)

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