Surface analysis with STM and AFM : experimental and theoretical aspects of image analysis
Language: English Series: Publication details: ; Weinheim : VCH, 1996 ; 1996Edition: Description: xii,323 p; 24.5 cmISBN: 3-527-29313-250Subject(s): | Surfaces (Technology)-Analysis | Image processing | Scanning tunneling microscopy | Atomic force microscopy| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
Central Library, IITB | 537.533:539.21 Mag | Available | G20A12 | 184336 |
Total holds: 0
There are no comments on this title.