Influence of temperature on microelectronics and system reliability

By: Lall, PradeepContributor(s): Pecht, Michael G | Hakim, Edward B | Language: English Series: Publication details: ; Boca Raton : CRC Press, 1997 ; 1997Edition: Description: 307 p; 26 cmISBN: 0-8493-9450-310Subject(s): | Microelectronics-Materials-Thermal properties | Electronic packaging | Electronic apparatus and appliances-Reliability
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
621.372:621.382 Lal Available G35B42 182729
Total holds: 0

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