Nondestructive evaluation of semiconductor materials and devices / edited by Jay N. Zemel
Language: English Series: Publication details: New York ; Plenum Press, ; 1979Edition: Description: xi,782 p; 24.5 cmISBN: 0-306-40293-91Subject(s): | Semiconductors-Testing congresses| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Books
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Central Library, IITB | 621.382:620.179.1 Non:78(2) | Available | G37A16 | 109575 | ||
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Books
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Central Library, IITB | 621.382:620.179.1 Non:78 | Available | G37A16 | 106476 |
Total holds: 0
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