Characterization of defects in materials : symposium, Boston, Dec.1-2, 1986 / edited by Richard W. Siegel, Julia R. Weertman and Robert Sinclair

By: Contributor(s): Language: English Series: Publication details: Pittsburgh ; Materials Research Society, ; 1987Edition: Description: xv,532 p; 22.5 cmISBN: 0-931837-47-20Subject(s): | Materials-Defects-Congresses | Crystals-Defects-Congresses
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
620.1 Cha:86 Available G30A02 147673
Total holds: 0

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