Characterization of defects in materials : symposium, Boston, Dec.1-2, 1986 / edited by Richard W. Siegel, Julia R. Weertman and Robert Sinclair
Language: English Series: Publication details: Pittsburgh ; Materials Research Society, ; 1987Edition: Description: xv,532 p; 22.5 cmISBN: 0-931837-47-20Subject(s): | Materials-Defects-Congresses | Crystals-Defects-CongressesItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 620.1 Cha:86 | Available | G30A02 | 147673 |
Total holds: 0
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