Photometric determination of traces of metals : general aspects

By: Sandell, E.BContributor(s): Onishi, Hiroshi | Language: English Series: Publication details: New York ; John Wiley, ; 1978Edition: 4th edDescription: pt.1; 22.5 cmISBN: 0-471-03094-53Subject(s): | Trace elements-Analysis | Metals-Analysis | Colorimetric analysis
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
543.43 San-1 Available G23B22 102750
Total holds: 0

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