Fundamentals of surface and thin film analysis

By: Feldman, Leonard CContributor(s): Mayor, James W | Language: English Series: Publication details: New York ; North-Holland, ; 1986Edition: Description: xviii,352 p; 23 cmISBN: 0-444-00989-216Subject(s): | Surfaces (Technology)-Analysis | Thin films-Analysis
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
539.2 Fel(2) Available G21A28 151488
Books Books Central Library, IITB
539.2 Fel Available G21A28 145906
Total holds: 0

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