Simulation of pulsed-ionizing-radiation-induced errors in CMOS memory circuits
Language: English Series: Publication details: ; Raleigh : North Carolona State University, 1987 ; 1987Edition: Description: vii,276 p; 20.5 cmISBN: 1Subject(s): | Metal oxide semiconductors, Complementary | Semiconductor devices-Computersimulation| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Books
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Central Library, IITB | 621.382:681.3 Mas | Available | G37A18 | 169656 |
Total holds: 0
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