Speckle metrology / edited by Rajpal S. Sirohi

By: Contributor(s): Language: English Series: Publication details: ; New York : Marcel Dekker, 1993 ; 1993Edition: Description: xiii,551 p; 22 cmISBN: 0-8247-8932-61Subject(s): | Non-destructive testing | Speckle metrology
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
620.l79.1 Spe Available G30B40 169280
Total holds: 0

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