Speckle metrology / edited by Rajpal S. Sirohi
Language: English Series: Publication details: ; New York : Marcel Dekker, 1993 ; 1993Edition: Description: xiii,551 p; 22 cmISBN: 0-8247-8932-61Subject(s): | Non-destructive testing | Speckle metrologyItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 620.l79.1 Spe | Available | G30B40 | 169280 |
Total holds: 0
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