Effects of the presence of 'Buffer' interlayers on the stress development and integrity of Si during electrochemical Li- and Na-storage (R)
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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Central Library, IITB Technical Processing Section | Reference | 669.884 Jan | Not for loan | 247754 |
Total holds: 0
Thesis Ph.D Indian Institute of Technology Bombay. Department of Metallurgical Engineering and Materials Science
2019
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