Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface
Language: English Series: Publication details: Stanford ; Stanford University, ; 1987Edition: Description: xxii,157 p; 20.5 cmISBN: 3Subject(s): | Silicon-Electric propertiesItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 621.382 Aki | Available | G36B36 | 143987 |
Total holds: 0
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