Basic program for calculating dopant density profiles from capacitance-voltage data
Language: English Series: NBS SMT SP - 400 - 11 : 1975Publication details: Washington, D.C. ; National Bureau of standards ; 1975Edition: Description: 38 p; ISBN: Subject(s): | BASIC, Capacitance-voltage measurements, Computer programs, dopant profiles, Error functionOnline resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode | Item holds |
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Pamphlets Standards Reports | Central Library, IITB | LNBS SMT SP - 400 - 11 : 1975 | Not for loan | A41080 |
Total holds: 0
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