Basic program for calculating dopant density profiles from capacitance-voltage data

Contributor(s): Language: English Series: NBS SMT SP - 400 - 11 : 1975Publication details: Washington, D.C. ; National Bureau of standards ; 1975Edition: Description: 38 p; ISBN: Subject(s): | BASIC, Capacitance-voltage measurements, Computer programs, dopant profiles, Error functionOnline resources: Click here to access online
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Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNBS SMT SP - 400 - 11 : 1975 Not for loan A41080
Total holds: 0

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