Digital systems testing and testable design

By: Abramovici, MironBreuer, Melvin A.Friedman, Arthur DContributor(s): Language: English Series: Publication details: New York ; IEEE Press, ; 1990Edition: Description: xvii,652 p; 26 cmISBN: 0-7803-1062-49Subject(s): | Digital circuits-Testing | Digital circuits-Design
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
621.374.32:681.3 Abr(2) Checked out to Ratnesh Upadhyay (24M1119) G36A27 10/10/2024 195909
Total holds: 0

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