Digital systems testing and testable design
Language: English Series: Publication details: New York ; IEEE Press, ; 1990Edition: Description: xvii,652 p; 26 cmISBN: 0-7803-1062-49Subject(s): | Digital circuits-Testing | Digital circuits-DesignItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 621.374.32:681.3 Abr(2) | Checked out to Ratnesh Upadhyay (24M1119) | G36A27 | 10/10/2024 | 195909 |
Total holds: 0
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