Optical thickness measurement of SiO2-Si3 N4 films on silicon

Contributor(s): Language: English Series: BTL TPR Opt. : 1967Publication details: New York ; BTL ; 1967Edition: Description: var. pages; ISBN: Subject(s): | Online resources: Click here to access online
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Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LBTL TPR Opt. : 1967 Not for loan A18583
Total holds: 0

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