On-chip test circuits to characterize high performance circuits hitting technological limits (R)
Language: English Series: Publication details: Mumbai ; IIT ; 2011Edition: Description: vi,44 p; 30 cmISBN: Subject(s): Sharma, Dinesh Amit | Theses and Dissertations | Systems on a chip-Testing , Integrated circuits-Very large scale integration- Testing| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Theses and Dissertations
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Central Library, IITB | 043:621.372:621.382Vis | Not for loan | D04A03 | 229867 |
Total holds: 0
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