Structured testing / Thomas J. McCabe

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: Silver Spring ; IEEE Computer Society Press, ; 1983Edition: Description: v,132 p; 28 cmISBN: 2Subject(s): | Computational complexity | Structured programming
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
681.3.06 Ins Available G55A36 119459
Total holds: 0

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