Area defects and their effect on yield and reliability (R)
Language: English Series: Publication details: Mumbai ; IIT ; 2003Edition: Description: v,52 p; 30 cmISBN: Subject(s): Apte, Prakash R | Theses and Dissertations | Integrated circuits-Reliability , Integrated circuits-Defects| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Theses and Dissertations
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Central Library, IITB | 043:621.382:519.28Rav | Not for loan | D06B20 | 200368 |
Total holds: 0
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