Genetic algorithms for VLSI testing and ATPG (R)

By: Tharakan, K.T. Oommen [Author]Contributor(s): Chandorkar, A.N [Supervisor] | Rao, S.S.S.P [Supervisor] | Indian Institute of Technology Bombay Department of Electrical EngineeringLanguage: English Publication details: Bombay ; IIT ; 2006Description: xiv,140 p; 29 cmSubject(s): Chandorkar, A.N. and Rao, S.S.S.P | Theses and Dissertations | Integrated circuits-Very large scale integration-Testing | Genetic algorithmsDissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008
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Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
Pamphlet Section (Theses, Standards, Reports) 		043:621.372:621.382 Tha Not for loan D08A26 210691
Total holds: 0

Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008

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