Scalability and reliability studies of CHISEL NOR flash EEPROMs (R)
Language: English Publication details: Bombay IIT 2005Description: xv,95 p; 29 cmSubject(s): Mahapatra, Souvik | Theses and Dissertations | Semiconductor memory-Reliability | EEPROM cell-Reliability | Read- only memoryDissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2005| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Theses and Dissertations
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Central Library, IITB Pamphlet Section (Theses, Standards, Reports) | 043:621.382:658.562 Nai | Not for loan | D08A26 | 205288 |
Total holds: 0
Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2005
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