Simulation directed test pattern generation for digital circuits (R)

By: Ganesh, RContributor(s): Venkatesh, G. and Verma, A.KLanguage: English Series: Publication details: Bombay ; IIT ; 1991Edition: Description: 40 p; 29 cmISBN: 0Subject(s): Venkatesh, G. and Verma, A.K | Theses and Dissertations | Digital Circuits
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
043:621.374.32:681.3:519.2Gan Not for loan D06B18 165338
Total holds: 0

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