Sigmetrics symposium on measurement and evaluation, 2nd , Montreal, Canada, Sept. 30-Oct. 2, 1974
Language: English Series: Publication details: New York ; ACM ; 1974Edition: Description: v,208 p; 27.5 cmISBN: Subject(s): | Computer Science and Engineering | Computer interfaces-Measurement-Congresses , Computer interfaces-Evaluation-Congresses| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Books
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Central Library, IITB Compact Storage - Basement Area | 681.3Ass:2:74 | Available | C19A13 | 105297 |
Total holds: 0
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