Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
Language: English Series: Publication details: New York ; Springer ; 2007Edition: Description: v.2; 24 cmISBN: 978-0367-28667-9Subject(s): | Electronics | Scanning probe microscope , Nanoelectronics , Scanning electronic microscopyItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 621.385.833Sca-2 | Available | G37B21 | 220409 |
Total holds: 0
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