Defect analysis in electron microscopy
Language: English Series: Publication details: London ; Chapman and Hall, ; 1975Edition: Description: ix,134 p; 23 cmISBN: 0-470-54760-X10Subject(s): | Crystals-Defects | Electron microscopyItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 620.187:548.4 Lor | Available | G31A06 | 108846 |
Total holds: 0
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