Defect analysis in electron microscopy

By: Loretto, M.HContributor(s): Smallman, R.E | Language: English Series: Publication details: London ; Chapman and Hall, ; 1975Edition: Description: ix,134 p; 23 cmISBN: 0-470-54760-X10Subject(s): | Crystals-Defects | Electron microscopy
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
620.187:548.4 Lor Available G31A06 108846
Total holds: 0

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