Normal view
MARC view
Entry Topical Term
001 - CONTROL NUMBER
- control field: 47343
003 - CONTROL NUMBER IDENTIFIER
- control field: OSt
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230429133731.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230429|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: OSt
- Transcribing agency: OSt
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Testing
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (OSt)166670: Sherlekar S.D. Author 46421, Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R), 1987