Normal view MARC view

Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

  • control field: 47343

003 - CONTROL NUMBER IDENTIFIER

  • control field: OSt

005 - DATE AND TIME OF LATEST TRANSACTION

  • control field: 20230429133731.0

008 - FIXED-LENGTH DATA ELEMENTS

  • fixed length control field: 230429|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

  • Original cataloging agency: OSt
  • Transcribing agency: OSt

150 ## - HEADING--TOPICAL TERM

  • Topical term or geographic name entry element: Testing

670 ## - SOURCE DATA FOUND

  • Source citation: Work cat.: (OSt)166670: Sherlekar S.D. Author 46421, Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R), 1987

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