X-ray and electron methods of analysis / edited by H. Van Olphen and William Parrish (Record no. 59526)

MARC details
000 -LEADER
fixed length control field 00563 a2200265 4500
001 - CONTROL NUMBER
control field 119841
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER
Universal Decimal Classification number 543:058 X-r
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name
245 ## - TITLE STATEMENT
Title X-ray and electron methods of analysis / edited by H. Van Olphen and William Parrish
250 ## - EDITION STATEMENT
Edition statement
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Plenum Press,
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Date of publication, distribution, etc. 1968
300 ## - PHYSICAL DESCRIPTION
Extent v.1
300 ## - PHYSICAL DESCRIPTION
Dimensions 23 cm
490 ## - SERIES STATEMENT
Series statement NASA TM - 85973 : 1984
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Chemistry, Analytic
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element X-ray analysis
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Cost, replacement price Price effective from Koha item type
          Central Library, IITB Central Library, IITB 01/02/2018 0.00   543:058 X-r 55522 01/02/2018 0.00 01/02/2018 Books

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