Point defect generation during oxidation of silicon in dry oxygen (Record no. 26430)

MARC details
000 -LEADER
fixed length control field 00516 a2200253 4500
001 - CONTROL NUMBER
control field 40137
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER
Universal Decimal Classification number 621.382 Dun
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Dunham, Scott Thayer
245 ## - TITLE STATEMENT
Title Point defect generation during oxidation of silicon in dry oxygen
250 ## - EDITION STATEMENT
Edition statement
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Stanford
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Stanford University,
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Date of publication, distribution, etc. 1985
300 ## - PHYSICAL DESCRIPTION
Extent 128 p.
300 ## - PHYSICAL DESCRIPTION
Dimensions 21.5 cm
490 ## - SERIES STATEMENT
Series statement
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Point defects
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Shelving location Date acquired Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Cost, replacement price Price effective from Koha item type
    Universal Decimal Classification     Central Library, IITB Central Library, IITB Compact Storage - Basement Area 01/02/2018 0.00   621.382 Dun 143985 01/02/2018 0.00 01/02/2018 Books