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Metal work-function induced threshold voltage variability in multi-gate transistors (R)

Penugonda, Harsha Vardhan

Metal work-function induced threshold voltage variability in multi-gate transistors (R) - Mumbai IIT 2019 - xx,92 p. 30 cm

Thesis

Subjects--Topical Terms:
Theses and Dissertations
Electronics
Semiconductors
Transistors
Voltage variability
Metal gate granularity

Universal Decimal Class. No.: 621.382.3 / Pen

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