Characterization and modeling of negative bias temperature instability in silicon oxynitride(SiON) and high-K/MG P-MOSFETs (R)
Deora, Shweta
Characterization and modeling of negative bias temperature instability in silicon oxynitride(SiON) and high-K/MG P-MOSFETs (R) - Mumbai IIT 2012 - xxiv, 181 p. 30 cm
Thesis
Silicon nitride ,
Metal oxide semiconductors field-effect transistors
Semiconductors--Effect of temperature on
043:621.382 / Deo
Characterization and modeling of negative bias temperature instability in silicon oxynitride(SiON) and high-K/MG P-MOSFETs (R) - Mumbai IIT 2012 - xxiv, 181 p. 30 cm
Thesis
Silicon nitride ,
Metal oxide semiconductors field-effect transistors
Semiconductors--Effect of temperature on
043:621.382 / Deo