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FinFET : a feasible condidate for sub-45 nm circuits (R)

Francis, Roswald

FinFET : a feasible condidate for sub-45 nm circuits (R) - - Mumbai IIT 2008 - vi,45 p. 30 cm - .

ISBN:

Subjects--Topical Terms:
Baghini, Maryam Shojaei
Theses and Dissertations
Metaloxide semiconductors field-effect transistors

Universal Decimal Class. No.: 043:621.382.3Fra

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