Recommendations on semiconductor devices : Methods of measurement of the characteristics of diodes and transistors
British Standards Institution
Recommendations on semiconductor devices : Methods of measurement of the characteristics of diodes and transistors - - London BSI 1966 - 58 - NBS SMT SP - 400 - 21 : 1976 .
DBSI-3494.2621.382.2/.3
Recommendations on semiconductor devices : Methods of measurement of the characteristics of diodes and transistors - - London BSI 1966 - 58 - NBS SMT SP - 400 - 21 : 1976 .
DBSI-3494.2621.382.2/.3