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High-field stressing of oxides in MOS structures (R)

Patrikar, R.

High-field stressing of oxides in MOS structures (R) - Bombay IIT 1992 - 265 p. 28 cm

Thesis

ISBN: 0

Subjects--Topical Terms:
Theses and Dissertations
Metal oxide semiconductors

Universal Decimal Class. No.: 043:621.382 / Pat

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