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Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale

Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale - - New York Springer 2007 - v.1 24 cm - .

ISBN: 978-0367-28667-9

Subjects--Topical Terms:

Electronics
Scanning probe microscope , Nanoelectronics , Scanning electronic microscopy

Universal Decimal Class. No.: 621.385.833Sca-1

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