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Rapid reliability assessment of VLSICs / A.P. Dorey...[et al.]

Rapid reliability assessment of VLSICs / A.P. Dorey...[et al.] - - New York : Plenum Press, 1990 1990 - ix,202 p. 25 cm - .

ISBN: 0-306-43492-X12

Subjects--Topical Terms:

Integrated circuits-Very largescale integration-Testing
Integrated circuits-Very largescale integration-Reliability

Universal Decimal Class. No.: 621.372:621.382 Rap

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